Ellipsometer (RC2)

$0.00

Description

Additional information

MANUFACTURER J.A. Woollam
MODEL RC2

Analyses

  • Quantitative analysis of polarized light in reflection mode
  • Lateral resolution: 200 µm
  • Mapping available: yes
  • Sampled depth: 0.1 to 1000 nm

Applications

  • Measurements of film thickness, refractive index, absorption coefficient, interfaces, doping, anisotropy, surface roughness, uniformity and porosity

Characteristics

  • Highly specialized equipment with a double compensator yielding a high accuracy. Possibility of measuring samples both anisotropic and depolarizing
  • Wavelengths: from 290 nm to 1690 nm
  • Variable angle and double compensator ellipsometer
  • Available modules: micro-spot objective, electrochemical cell, environmentally controlled heating/cooling chamber

 

Additional information

MANUFACTURER

J.A. Woollam

MODEL

RC2