Ellipsometer (RC2)
Ellipsometer (RC2)
Additional information
| MANUFACTURER | J.A. Woollam |
|---|---|
| MODEL | RC2 |
Analyses
- Quantitative analysis of polarized light in reflection mode
- Lateral resolution: 200 µm
- Mapping available: yes
- Sampled depth: 0.1 to 1000 nm
Applications
- Measurements of film thickness, refractive index, absorption coefficient, interfaces, doping, anisotropy, surface roughness, uniformity and porosity
Characteristics
- Highly specialized equipment with a double compensator yielding a high accuracy. Possibility of measuring samples both anisotropic and depolarizing
- Wavelengths: from 290 nm to 1690 nm
- Variable angle and double compensator ellipsometer
- Available modules: micro-spot objective, electrochemical cell, environmentally controlled heating/cooling chamber
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.