Scanning Electron Microscope (sem) (JSM 7401F)
Scanning Electron Microscope (sem) (JSM 7401F)
Additional information
| MANUFACTURER | JEOL |
|---|---|
| MODEL | JSM 7401F |
Samples
- Sample size: 150 mm maximum
- Thickness: 5 mm maximum
Analysis
- Acceleration: 0.1 keV to 30 keV
- Resolution : about 1 nm
Variants
- Phase analysis by backscattered electron detection
- Energy Dispersive Spectrometer (EDS) for X-ray elemental analysis
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.