Scanning Electron Microscopy (SEM) with EDS
Scanning Electron Microscopy (SEM) with EDS
| MANUFACTURER | Thermo Fisher Scientific |
|---|---|
| MODEL | Phenom ProX |
General description:
The Phenom ProX Scanning Electron Microscope (SEM) offers super-fast, high-resolution imaging combined with an integrated energy-dispersive X-ray spectroscopy (EDS) detector, enabling robust, user-friendly, and rapid elemental analysis.
Operating at accelerating voltages between 5 kV and 15 kV, the instrument allows the analysis of a wide range of materials, including biomaterials, organic and inorganic materials, making it suitable for both academic research and applied industrial characterization.
Characteristics :
- Magnification: 80× to 150,000×
- Resolution: ≤ 10 nm
- Accelerating Voltages: 5 kV, 10 kV, 15 kV
- Sample Size Capacity:
- Up to 25 mm diameter
- Up to 35 mm height
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.