Time of Flight Secondary Ion Mass Spectrometer (tof-sims)

$0.00

Description

Additional information

MANUFACTURER ION-TOF Gmbh
MODEL NR-9200HR

Intrument unique in Quebec :

  • Allowing analysis with high mass resolution ( 0.0001 amu) and a high sensitivity of the order of the ppb
  • Semi-quantitative surface analysis: spectroscopy, imaging and depth profiling
  • Measurement depth: from 2-3 monolayers to 1-2 micrometers
  • Mapping available
  • Lateral resolution: 150 nm

Applications

  • Analysis of solid surface chemistry, including fragile elements such as proteins

Additional information

MANUFACTURER

ION-TOF Gmbh

MODEL

NR-9200HR