X-Ray Diffractometer (xrd) (D8 Advance)
X-Ray Diffractometer (xrd) (D8 Advance)
Additional information
| MANUFACTURER | Bruker |
|---|---|
| MODEL | D8 Advance |
Samples
- Types : powder, thin film, ceramics …
- Sample size: maximum 38 mm (1.5 in.) disk
- Thickness : 5 mm
Applications
- Semi-quantitative or quantitative analysis
- Bragg-Brentano incident method for powders and grazing angle method for thin films
- Identification of crystallographic phases
- Determination of crystallite sizes
Characteristics
- X-ray source : CuKα, l = 1.542 Å
- Parallel beam (Göbel mirror) and divergent beam (“powder” method)
- Configuration θ/2θ (fix source)
- Detector : scintillator
- Four Anton Paar XRK900 for in-situ measurements across temperature (20 °C to 900 °C), pressure (1 mbar à 10 bars) and controlled atmosphere
- Detector 2 Dimensions (GADDS)
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.