X-Ray Diffractometer (xrd) (D8 Advance)

$0.00

Description

Additional information

MANUFACTURER Bruker
MODEL D8 Advance

Samples

  • Types : powder, thin film, ceramics …
  • Sample size: maximum 38 mm (1.5 in.) disk
  • Thickness : 5 mm

Applications

  • Semi-quantitative or quantitative analysis
  • Bragg-Brentano incident method for powders and grazing angle method for thin films
  • Identification of crystallographic phases
  • Determination of crystallite sizes

Characteristics

  • X-ray source : CuKα, l = 1.542 Å
  • Parallel beam (Göbel mirror) and divergent beam (“powder” method)
  • Configuration θ/2θ (fix source)
  • Detector : scintillator
  • Four Anton Paar XRK900 for in-situ measurements across temperature (20 °C to 900 °C), pressure (1 mbar à 10 bars) and controlled atmosphere
  • Detector 2 Dimensions (GADDS)

 

Additional information

MANUFACTURER

Bruker

MODEL

D8 Advance