X-Ray Diffractometer (xrd) (X’Pert)

$0.00

Description

Additional information

MANUFACTURER Philips
MODEL X’Pert

Samples

  • Types: all crystalline materials (metals, ceramics, inorganic materials, composites, etc.) as bulk or powder materials

Analysis

  • Identification of phases and components
  • Semi-quantitative or quantitative (with standards)
  • Applications: measurement of mechanical stress, phase identification, low angle measurement

Applications

  • Measurement of mechanical stress
  • Phase identification
  • Low angle measurement

Characteristics

  • Two detectors: powder method (Bragg-Breantano) and low angle method
  • Interchangeable X-ray sources (Cu or Co)

Additional information

MANUFACTURER

Philips

MODEL

X’Pert