X-Ray Diffractometer (xrd) (X’Pert)
X-Ray Diffractometer (xrd) (X’Pert)
Additional information
| MANUFACTURER | Philips |
|---|---|
| MODEL | X’Pert |
Samples
- Types: all crystalline materials (metals, ceramics, inorganic materials, composites, etc.) as bulk or powder materials
Analysis
- Identification of phases and components
- Semi-quantitative or quantitative (with standards)
- Applications: measurement of mechanical stress, phase identification, low angle measurement
Applications
- Measurement of mechanical stress
- Phase identification
- Low angle measurement
Characteristics
- Two detectors: powder method (Bragg-Breantano) and low angle method
- Interchangeable X-ray sources (Cu or Co)
Related products
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.