Description
Additional information
MANUFACTURER | Bruker |
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MODEL | D8 Advance |
Samples
- Types : powder, thin film, ceramics …
- Sample size: maximum 38 mm (1.5 in.) disk
- Thickness : 5 mm
Applications
- Semi-quantitative or quantitative analysis
- Bragg-Brentano incident method for powders and grazing angle method for thin films
- Identification of crystallographic phases
- Determination of crystallite sizes
Characteristics
- X-ray source : CuKα, l = 1.542 Å
- Parallel beam (Göbel mirror) and divergent beam (“powder” method)
- Configuration θ/2θ (fix source)
- Detector : scintillator
- Four Anton Paar XRK900 for in-situ measurements across temperature (20 °C to 900 °C), pressure (1 mbar à 10 bars) and controlled atmosphere
- Detector 2 Dimensions (GADDS)