Atomic Force Microscopy (afm) (Dimension TM 3100)

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Description

Additional information

MANUFACTURER Digital Instruments
MODEL Dimension TM 3100

Analyses

  • Modes: contact, tapping, nano-indentation
  • Available tips :
    • Contact mode : SiN
    • Tapping mode : Si, radii 10 nm and 2 nm
    • Nano-indentation : Berkovich diamond tip (radius 50 nm)
  • Liquid milieu sample analysis

Applications

  • Determination of topography, phases, hardness and thickness parameters

 

Additional information

MANUFACTURER

Digital Instruments

MODEL

Dimension TM 3100