Ellipsometer (VVASE)
Ellipsometer (VVASE)
Additional information
| MANUFACTURER | J.A. Woollam |
|---|---|
| MODEL | VVASE |
Samples
- Sample sizes: maximum 150 mm x 150 mm (6ˮ x 6ˮ)
- Thickness : maximum 1 cm
Analysis
- Measurement of thin films optical constants and thickness (quantitative)
- Mapping possible
- Spectral resolution: 0.05 nm
- Measurements via transmission or reflexion mode
Applications
- Thickness measurement of anisotropic films
- Measurement of dielectric lens transmission
Characteristics
- Wavelengths: from 240 to 2500 nm
- Micrometric sample holder scanning a 45 x 45 mm area on a sample size up to 150 mm
- Ellipsometric analysis across a 20 ºC to 300 ºC temperature range
- Self-retarding plate for depolarization measurement
- Micro-spot objective for a 100 µm beam
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.