Description
Additional information
MANUFACTURER | JEOL |
---|---|
MODEL | JSM 2100-F |
Samples
- Samples are prepared with an Focused Ion Beam dedicated to the preparation of thin lamellas
Analysis
- High Resolution Imaging (dark and light background)
- Equipped with Field Effect Gun working with an acceleration voltage of 200 kV and 100 kV
- Lateral resolution : 0.19 nm
Characteristics
- Instrument unique in Canada, equipped with a Field Effect Gun capable of a very high resolution for imaging, X-ray mapping and PEELS
Variants
Energy Dispersive Xray Spectrometry (EDS) for chemical analysis
- Qualitative and quantitative analysis
- Mapping possible
Parallel Electron Energy Loss Spectroscopy (PEELS) for chemical analysis and thickness measurement
- Qualitative and quantitative analysis
- Mapping possible