Transmission Electron Microscope (tem)

$0.00

Description

Additional information

MANUFACTURER JEOL
MODEL JSM 2100-F

Samples

  • Samples are prepared with an Focused Ion Beam dedicated to the preparation of thin lamellas

Analysis

  • High Resolution Imaging (dark and light background)
  • Equipped with Field Effect Gun working with an acceleration voltage of 200 kV and 100 kV
  • Lateral resolution : 0.19 nm

Characteristics

  • Instrument unique in Canada, equipped with a Field Effect Gun capable of a very high resolution for imaging, X-ray mapping and PEELS

 

Variants

Energy Dispersive Xray Spectrometry (EDS) for chemical analysis

  • Qualitative and quantitative analysis
  • Mapping possible

Parallel Electron Energy Loss Spectroscopy (PEELS) for chemical analysis and thickness measurement

  • Qualitative and quantitative analysis
  • Mapping possible

Crystallographic analysis

Additional information

MANUFACTURER

JEOL

MODEL

JSM 2100-F