Transmission Electron Microscope (tem)
Transmission Electron Microscope (tem)
Additional information
| MANUFACTURER | JEOL |
|---|---|
| MODEL | JSM 2100-F |
Samples
- Samples are prepared with an Focused Ion Beam dedicated to the preparation of thin lamellas
Analysis
- High Resolution Imaging (dark and light background)
- Equipped with Field Effect Gun working with an acceleration voltage of 200 kV and 100 kV
- Lateral resolution : 0.19 nm
Characteristics
- Instrument unique in Canada, equipped with a Field Effect Gun capable of a very high resolution for imaging, X-ray mapping and PEELS
Variants
Energy Dispersive Xray Spectrometry (EDS) for chemical analysis
- Qualitative and quantitative analysis
- Mapping possible
Parallel Electron Energy Loss Spectroscopy (PEELS) for chemical analysis and thickness measurement
- Qualitative and quantitative analysis
- Mapping possible
Crystallographic analysis
Related products
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.